Comparing Classification Performance of Mueller Matrix Parameters for Diffuse Materials
نویسندگان
چکیده
منابع مشابه
Mueller matrix ellipsometry studies of nanostructured materials
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ژورنال
عنوان ژورنال: Electronic Imaging
سال: 2020
ISSN: 2470-1173
DOI: 10.2352/issn.2470-1173.2020.14.coimg-263